Beamline Description

Measurement station

The scheme of the experimental chamber is the following: Focusing optics Electron analyzer Sample holder on scanning stage

Nanospot for microscopy

The measurement station hosts a microscope which is based on a Schwarzschild Objective. Such a device consists of two spherical mirrors which demagnify the beamline focus to a submicron spot onto the sample. High reflectivity of the Schwarzschild Objective is obtained by using periodic multilayer coating. Two objectives are available which operate at photon energies of 27eV and 74eV. The smallest achievable spot size is currently 0.5 µm FWHM.

Photoemission detection

The photoelectrons emitted from the sample are detected by angle-resolved hemispherical electron analyser installed on two-axis goniometer.

Mean radius: 40 mm Working distance: 15 mm Entrance slit: 0.5 x 12 mm2 Energy resolution: 12.5 meV Energy‐dispersive multichannel detection for spectroimaging Acceptance angle: 16 degrees Angular modes of operation: AP or angle to point dispersive modes with 0.37- 2 mm/degree dispersions Detector: 2D delay line with working area 20x20 mm2

Sample scanning

Scanning stage with three linear axes and rotation around vertical axis
Travel range: 25x25x15 mm
Precision: 100 nm in close loop operation
Accelerations: up to 5 mm sec^-2 (20 msec per 500 nm step, 28 msec per 1 μm step)
Ultimate speeds: up to 280 µm sec^-1
The sample can be cooled down via copper braid attached to the flow cryostat down to 20 K and warmed up to 450 K.