Specifications

Beamline: insertion device

source:	1m Fixed-gap adjustable-phase double undulator with 25 mm period low energy and 13 mm period high energy
energy range:	400-2200 eV

Beamline: monochromator

grating	energy range	resolving power
600 l/mm Au grating	150-1000 eV	depends on the exit slits1
600 l/mm Au grating	400-4000 eV	depends on the exit slits1

[1] Gianoncelli A., Kourousias G., Merolle L., Altissimo M., Bianco A. Current status of the TwinMic beamline at Elettra: a soft X-ray transmission and emission microscopy station Journal of Synchrotron Radiation, Vol. 23 - 6, pp. 1526-1537 (2016)  doi: 10.1107/S1600577516014405

Microscope: TwinMic

Zone plate lens for STXM: (1) 600um diameter and 50nm outermost zone width; (2) 320um diameter and 50nm outermost zone width; (3) MultiLevel Zone plate 500um diameter and 50nm outermost zone width
illumination apertures: 15, 25, 35, 50, 75, 100 and 150 µm.
Angle of incidence photon beam - sample: 90° with the vertical plane.

Fluorescence Detector: 8 Silicon Drift Detectors (SDDs) with <135eV FWHM at 5.9 keV and efficiency >90% over the entire energy range.

Sample stage

Sample stage
Stepper motors (National instruments)	± 6 mm
Piezoelectric motors (PI)	± 40 um

The sample stage consist of two stepper motors (providing X and Y movement) and piezoelectric PI motors providing X and Y movement for scanning mode.

Experimental Facilities

• VL digital microscpe (Keyence Serie VHX-7000)
• VL stereomicroscope
• Oven
• Ultrasonic bath