Beamline
Physical layout of the beamline
The front end, which is common for the two branch lines, includes two beam position monitors and a slit system constructed and feedback controlled in order to keep the photon beam well centred. The first section after the front end also is common and contains a mirror chamber hosting the switching mirrors alternatively delivering the beam to the two branch Lines.
A drawing of the ESCA microscopy beamline after the switching mirrors section is shown in Figure. These sections contain the following components: (i) prefocusing mirror chamber; (ii) monochromator block consisting of entrance and exit slit subchambers and a main chamber, which hosts two gratings and a plane mirror; (iii) connecting elements, water cooling, automatic electropneumatic gate values, and pumping units (ion pumps).
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Monitors for pressure (Pirani-Penning and Bayard-Alpert gauges), residual gas (quadruple mass spectrometers), and temperature (thermocouples) are installed at various points on the beamline. As indicated in Fig. 1, retractable diagnostics can be inserted at three different points on the beamline. These diagnostics contain a fluorescence screen (A1,O1 doped with Cr) and a semiconductor photodiode (IRD, AXUV-100). They are used for calibration and characterization of the beamline performance: beam position and photon flux.
Optical scheme of the beamline
The requirements for the source for the x-ray microscope, to preserve the central brightness and cut the incoherent part of the photon flux, are met by a modified version of a spherical grating monochromator (SGM) with a fixed entrance and exit slits.
The SGM prefocusing system consists of a toroidal mirror performing a sagittal focusing of the beam into the entrance slit and tangential focusing into the exit slit. The plane mirror in combination with the grating allows the deflection angle at the grating to be changed in order to operate with minimal defocus aberration. The monochromator has two gratings with 600 and 1200 grooves/mm, which operate in outside diffraction order configuration with a deflection angle of 1740 and perform sagital focusing to the exit slit (see figure for the optical scheme of the beamline). A variable pinhole at the exit allows the beam to be tailored to the right conditions for illumination of the zone plates. According to the specification, the instrumental transmission should be of the order of 1% providing a resolution of 0.1 eV at the C K edge in a 30 µm exit slit. The tuning range covers photon energies from 250 to 1200 eV.
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Resolving power of monochromator
Energy calibration and evaluation of the resolving power of the monochromator were performed measuring photoabsorption spectra of well characterized gases (N2 and Ar). The performance of the monochromator is illustrated by the data in Figure. The theoretical resolving power reported in the figure was calculated considering different contributions like exit slit dimension, coma aberration, diffraction limit, and measured grating slope error. Experimental measurements at two photon energy points for Ar (244eV) and N (400eV) edges show good quantitative agreement with theoretical values.
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Brightness, coherent flux and harmonics
The brightness and coherent flux of the undulator source at 0.1% of the bandwidth are reported in the following table. One should keep in mind that the transmission of the beamline is of the order of 1% which was also calculated theoretically and confirmed experimentally. The transmission is maximised at around 500eV for the 600l/mm grating and at 700eV for 1200l/mm grating. Relative transmissions at different photon energies are shown in the figure where the 2.0 GeV spectra for different undulator gaps and harmonics and differnt monocromator gratings are plotted.
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References
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Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures;
Majid Kazemian Abyaneh, Luca Gregoratti, Matteo Amati, Matteo Dalmiglio and Maya Kiskinova;
e-Journal of Surface Science and Nanotechnology Vol. 9 (2011) pp.158-162 (retrive article)
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OPTIMIZATION OF A SPHERICAL GRATING MONOCHROMATOR FOR SOFT-X-RAY MICROSCOPY APPLICATIONS ;
W. Jark, P. Melpignano;
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 349 (1): 263-268 SEP 15 1994
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ESCA MICROSCOPY BEAMLINE AT ELETTRA ;
L. Casalis, W. Jark, M. Kiskinova, D. Lonza, P. Melpignano, D. Morris, R. Rosei, A. Savoia, A. Abrami, C. Fava, P. Furlan, R. Pugliese, D. Vivoda, G. Sandrin, F.-Q. Wei, S. Contarini, L. Deangelis, C. Gariazzo, P. Nataletti, G. Morrison ;
REVIEW OF SCIENTIFIC INSTRUMENTS 66 (10): 4870-4875 OCT 1995.