BaDElPh Highlights
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- Anomalies at the DP in graphene
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- QWS on bilayer graphene
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Attenuation lengths of low-energy electrons in solids
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The effective attenuation length (EAL) of low-energy electrons in oxides (CoO, MgO) and in a rare earth film (Yb) is investigated by photoemission spectroscopy experiments (5<hv<28 eV). In all cases the EAL is found to increase when lowering the electron energy, but the experimental values are smaller than expected from the predictive formula, i.e. the so-called “universal curve”. In particular, for the Yb case the experimental EAL is found to be a factor of four smaller than those predicted from the “universal curve”, while for the small-gap (EgCO= 2.5 eV) insulator CoO a factor of six is found. For the large gap (EgMgO= 7.77 eV) insulator MgO, instead, a steep increase in the EAL for energies smaller than the insulator optical gap of MgO is found. The comparison of the experimental results with calculated optical properties available in the literature suggests that, for energies lower than 20 eV, the relevant scattering mechanisms are described by the imaginary part of the dielectric function, accounting in particular for the steep increase of the EAL for energies smaller than the insulator band gap. |
A favorable comparison of our results with a band structure calculation for MgO highlights how the absorptive part of the dielectric function can be directly correlated with the measured effective attenuation length at very low energy. Retrieve articles Effective attenuation lengths of low energy electrons in MgO thin films S. Iacobucci, F. Offi, P. Torelli, L. Petaccia, J. Electron Spectr. Rel. Phenom. 233, 1 (2019). doi: 10.1016/j.elspec.2019.03.002 The attenuation length of low energy electrons in Yb F. Offi, S. Iacobucci, L. Petaccia, S. Gorovikov, P. Vilmercati, A. Rizzo, A. Ruocco, A. Goldoni, G. Stefani, G. Panaccione, J. Phys.: Condens. Matter 22, 305002 (2010). doi: 10.1088/0953-8984/22/30/305002 Attenuation lengths of low-energy electrons in solids: The case of CoO F. Offi, S. Iacobucci, P. Vilmercati, A. Rizzo, A. Goldoni, M. Sacchi, G. Panaccione, Phys. Rev. B 77, 201101(R) (2008). doi: 10.1103/PhysRevB.77.201101 |