Specifications
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Cryomagnet 6T XMCD
| Description | Currently NOT AVAILABLE to users. If interested for a long-term project please contact us. XAS (X-ray Absorption Spectroscopy) in total eletron yield (drain current) and total fluorescence yield (photodiode), XMCD (X-ray Magnetic Circular Dichroism) and X(M)LD [X-ray (Magnetic) Linear Dichroism] under high magnetic fields (superconducting magnet) and at variable temperature 1.8 K-340 K. Optical ports for laser in-laser out. A surface preparation and sample growth facility is in preparation. UHV environment. |
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| Spectrometer | Total electron yield drain current -6.5 to +6.5 Tesla superconducting magnet 1.8 K-340 K cryostat |
| Base Pressure | 5 * 10-10 [mbar] |
| Sample | |
| Sample Type | Crystal, Amorphous |
| Manipulator or Sample stage | |
| Manipulator | |
Multispectroscopy XPS/ARPES/XAS/XES
| Description | PES (Photoelectron Spectroscopy), automatic ResPES (Resonant Photoemission Spectroscopy), VUV and soft x ray ARPES (Angle Resolved Photoemission Spectroscopy), Temperature-programmed PES, XAS (X-ray Absorption Spectroscopy) in total electron yield (both drain current and a channeltron are available), partial electron yield (using the electron analyzer), total fluorescence yield (MCP), partial fluorescence yield (using the fluorescence grating spectrometer), XMCD (X-ray Magnetic Circular Dichroism) in remanence, X(M)LD [X-ray (Magnetic) Linear Dichroism] in remanence, SXES (Soft X-ray Emission Spectroscopy) and inelastic scattering spectroscopy RXES (Resonant X-ray Emission Spectroscopy), Low Energy Electron diffraction (LEED), Surface preparation and sample growth facilities. Variable sample temperature 120 K - 1300 K (sample temperature down to 50 K possible with LHe cooling). Optical ports for laser in-laser out. UHV environment. Currently used also for pump-probe time resolved XAS in total fluorescence yield. Sample cell for fluoresce yield measurements in liquid environment. | ||||||||
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| Microscopes | Not available at the beamline. However an ex situ microscope facilities are available upon request. | ||||||||
| Spectrometer | 1) Scienta3000 hemispherical electron energy analyzer for angle-resolved photoemission spectroscopy (energy resolution better that 3 meV and angular resolution better than 0.5°, quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum. The same instrument can be used to acquire core levels, work function, VUV to soft x ray ARPES, automatic energy dependent ARPES, Partial Yield XAS (secondary or Auger electrons), together with the drain current from the sample (TEY), automatic resonant photoemission and temperature-programmed photoemission 2) ComIXS fluorescence spectrometer with grating for x-ray emission spectroscopy and partial fluorescence yield spectroscopy and medium resolution (~1 eV at 800 eV)- (ask if operative) 3) Channeltron and MCP (ask if available/installed) 4) Keithleys (428 and 6430) for drain current x-ray absorption spectroscopy 5) Ultrafast MCP for total fluorescence yield time-resolved x-ray absorption spectroscopy | ||||||||
| Base Pressure | 2 * 10-10 [mbar] | ||||||||
| Detectors Available | fast MCP Drain Current | ||||||||
| Endstation Operative | Yes | ||||||||
| Sample | |||||||||
| Sample Type | Crystal, Amorphous | ||||||||
| Other Sample Type | liquid (after contacting beamline scientist about feasibility) | ||||||||
| Mounting Type | clamps, epoxy glue, silver paint, carbon tape... | ||||||||
| Required Sample Size | X = 5000 [um], Y = 2000 [um], Z = 1000 [um] | ||||||||
| Techniques usage | |||||||||
| Absorption / NEXAFS | TEY (drain current),PEY (secondary electrons measured by the Scienta analyser) , AEY (Auger electrons measured by the Scienta analyser), TFY (photon out measured by the MCP) ,PFY (energy resolved photon out by the ComIXS-currently not available to users) | ||||||||
| Absorption / Time-resolved studies | Optical excitation of the sample is done by laser pulses (synchronized to either hybrid or multi bunch SR pulses), and probing is performed by time-delayed synchrotron radiation pulses. | ||||||||
| Absorption / XMCD | In Remanenece after in situ magnetization with a permanent magnet of 0.5-1T or a variable magnetic field from 0 to 1 kGauss | ||||||||
| Emission or Reflection / X-ray fluorescence (XRF) | ComiX spectromenter http://www.elettra.trieste.it/lightsources/elettra/elettra-beamlines/bach/bach-endstations/page-8.html?showall= | ||||||||
| Photoelectron emission / Angular Resolved PES | VUV and SOFT-X RAY ARPES from 44eV to 1650 eV. Energy dependent ARPES with automatic control of the energy in the sequence Energy resolution better that 3 meV and angular resolution better than 0.5°, quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum http://www.elettra.trieste.it/lightsources/elettra/elettra-beamlines/bach/scienta3000.html | ||||||||
| Photoelectron emission / Photoelectron diffraction | Energy dependent PhD with automatic control of the energy in the sequence or Polar angle scans | ||||||||
| Photoelectron emission / UPS | Shallow core levels and angle resolved valence band. Energy dependent measurements with automatic control of the energy in the sequence Work function measurements. | ||||||||
| Photoelectron emission / XPS | Core levels. Resonant photoemission or energy dependent measurements with automatic control of the energy in the sequence. Temperature-programmed XPS. Quick acquisition mode to perform fast photoemission with 300 msec total acquisition time per spectrum | ||||||||
| Scattering / Inelastic scattering | Medium-resolution soft x-ray RIXS. Currently not available to users. | ||||||||
| Manipulator or Sample stage | |||||||||
| Manipulator |
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| Sample Environment | |||||||||
| Main XPS Chamber Environment |
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| Preparation chamber Environment |
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| Sample Holders | |||||||||
| Direct current heating sample holder |
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| E-Beam sample holder | |||||||||
| Omicron-plate compatibe sample holder |
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| PBN sample holderXL25HC: Heat and Cool block |
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| PBN sample holder XL25VH: very hot block |
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| Magnetic Fields | |||||||||
Preparation Chamber
| Description | crystal cleaver Scraper - diamond file / cleaver Ar+/Ne+ ion sputtering system 1 Leak Valve 2-degree-of-freedom (theta, z) manipulator (continuous annealing up to 700 K, flash up to 1400 K) Electro Magnet for in-plane magnetization at room temperature from 0 to 1 kGauss Ports for user evaporators, including a retractable port with gate valve for fast mounting Pressure gauge and Residual Gas Analyser . p<3x10-10 mbar |
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| Spectrometer | RGA |
| Base Pressure | 2 * 10-10 [mbar] |
| Endstation Operative | Yes |
| Sample | |
| Sample Type | Crystal, Amorphous |
Time-resolved XAS
| Description | The experimental setup of the BRANCH A can also combine Laser and Synchrotron Radiation (SR) in order to study the dynamics of the photo-induced excited states of electronic and magnetic systems with pump-probe time-resolved x-ray absorption spectroscopy. Elettra Synchrotron radiation source provide radiation pulse widths sufficiently short to investigate dynamic processes in the time between 70 ps up to 0.5 μs. Typically, optical excitation of the sample is done by laser pulses (synchronized to either hybrid or multi bunch SR pulses), and probing is performed by time-delayed synchrotron radiation pulses. |
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| Spectrometer | Fluorescence yield ultrafast MCP Hamamatsu, response time =100 ps |
| Base Pressure | 1 * 10-10 [mbar] |
| Detectors Available | ComIXS Fluorescence Spectrometer Scienta3000 Electron Analyser fast MCP Drain Current |
| Sample | |
| Sample Type | Crystal, Amorphous, Liquid |
