Nanospectroscopy Beamline Description

Overview

In order to achieve high spatial resolution and maximize collection efficiency, the beamline was designed to convey the highest possible flux density at the microscope focus. Target requirements were met by combining an insertion device with a moderate energy resolving power monochromator, together with micro -spot refocusing of the photon beam. In order to match the typical working conditions of the microscope (field of view 2 μm to 10 μm), the beamline strongly demagnifies the source, providing homogeneous illumination of the sample area which is imaged by the microscope.

Beamline Layout

The light source is the middle-point between the two undulator sections 1.1 and 1.2 with phase modulator electromagnet . At 10 m from the source middle position, the pinhole (PH) sets the beamline angular acceptance and stops unwanted radiation from the undulator. The toroidal mirror (TM) demagnifies the source by a factor of 8 in the horizontal plane and 5.3 in the vertical. The entrance slits are located at the horizontal (HS) and vertical (VS) foci of the toroidal mirror. The HS slit becomes the virtual source for all of the following mirrors in the horizontal plane. The light is then dispersed by the monochromator, which also determines a further vertical demagnification by a factor 1.7. After the exit-slit (ExS), a retractable plane mirror allows switching operation between the two branches of the beamline. The refocusing mirrors are two bendable mirrors arranged in a Kirkpatrick-Baez geometry. They are located in dedicated vacuum chambers. On the beamline first branch, the demagnification introduced by these elements is 11.5 in the horizontal direction and 5 in the vertical direction. For the second branch, the demagnification factors are 13.9 and 7.6, for the horizontal and the vertical direction respectively.