Specifications

References

The X-ray diffraction beamline MCX at Elettra: a case study of non-destructive analysis on stained glass
Plaisier Jasper Rikkert, Nodari Luca, Gigli Lara, Rebollo San Miguel Elena Paz, Bertoncello Renzo, Lausi Andrea
ACTA IMEKO, Vol. 6 - 3, pp. 71-75 (2017)
doi: 10.21014/acta_imeko.v6i3.464


MCX: A synchrotron radiation beamline for X-ray diffraction line profile analysis 
Rebuffi L, Plaisier JR, Abdellatief M, Lausi A, Scardi P 
Zeitschrift fur Anorganische und Allgemeine Chemie 640  3100–3106. (2014). 
doi: 10.1002/zaac.201400163