Beamline description

References

1. Scanning Photoelectron Microscopy: a Powerful Technique for Probing Micro and Nano-Structures
   Majid Kazemian Abyaneh, Luca Gregoratti, Matteo Amati, Matteo Dalmiglio and Maya Kiskinova
   e-Journal of Surface Science and Nanotechnology Vol. 9 (2011) pp.158-162 (doi: 10.1380/ejssnt.2011.158)

2. Optimization of a spherical grating monocromator for soft X-Ray microscopy applications
   W. Jark, P. Melpignano
   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 349 (1): 263-268 SEP 15 1994

3. ESCA microscopy beamline at elettra
   L. Casalis, W. Jark, M. Kiskinova, D. Lonza, P. Melpignano, D. Morris, R. Rosei, A. Savoia, A. Abrami, C. Fava, P. Furlan, R. Pugliese, D. Vivoda, G. Sandrin, F.-Q. Wei, S. Contarini, L. Deangelis, C. Gariazzo, P. Nataletti, G. Morrison
   REVIEW OF SCIENTIFIC INSTRUMENTS 66 (10): 4870-4875 OCT 1995.