Soft x reflectivity of organic films
Polarized resonant soft x ray reflectivity was taken at the carbon K-edge of a self assembled organic film of 1,4-benzenedimethanethiol (BDMT) molecules deposited on gold. The measured reflectivity was simulated by a parameterized phenomenological model, which was fitted to the experimental lineshape. The organic film was treated as an anisotropic material, described by a dielectric tensor with elements obtained from the anisotropic absorption cross section of the molecules, calculated through density functional theory (DFT). L. Pasquali et al., Physical Review B. 89, 045401 (2014)
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A quantitative approach was developed for the determination of molecular arrangement and electronic structure in anisotropic organic ultra-thin films based on polarized reflectivity at the carbon K-edge. Spectra were fitted to a parameterized model calculation. To simulate reflectivity, the anisotropic film was described by a dielectric tensor, obtained by ab-initio calculations for the single molecule and suitable rotations to describe the molecular organization in film domains. |
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Structural and electronic properties of anisotropic ultrathin organic films from dichroic resonant soft x-ray reflectivity, |
